Application Note Semiconductor Elemental and Particle Analysis of N-Methyl-2-Pyrrolidone (NMP) by ICP-MS/MS Analysis of dissolved and particulate inorganic impurities in two grades of NMP using the Agilent 8900 ICP-QQQ Author Introduction Yoshinori Shimamura Ideally, analytical quality control (QC) testing procedures…
Key words
nmp, ppt, grade, icp, particle, conc, nanoparticle, semiconductor, grades, elements, impurities, gas, fabs, nps, industry