Combined Analysis of a Contaminant Using a Compact FTIR and EDX

Importance of the Topic

The demand for sensitive and efficient contaminant detection in food production and chemical manufacturing has grown significantly. Combined use of Fourier transform infrared spectroscopy and energy dispersive X ray fluorescence addresses both organic and inorganic analysis needs, enabling comprehensive identification of unknown particles.

Objectives and Study Overview

This study demonstrates a workflow for rapid contaminant analysis using a compact FTIR spectrophotometer and an EDX spectrometer integrated with dedicated software. The aim is to streamline detection of organic polymers and inorganic minerals in a single sample.

Used Methodology and Instrumentation

The workflow consists of sequential measurements on FTIR and EDX using a common sample holder and dedicated software to combine results. Measurements on FTIR were performed with a diamond ATR accessory under specified resolution and accumulation conditions. EDX analysis employed a Rh target tube in vacuum mode with defined voltage and measurement time. EDXIR Analysis software matched spectra to a contaminant library containing 485 entries.

• FTIR instrument IRSpirit with single reflection ATR accessory and diamond prism
• IR Pilot software for guided FTIR data acquisition
• EDX instrument EDX 7000 with Rh tube and vacuum atmosphere
• EDXIR Holder sample mount for seamless transfer between FTIR and EDX
• EDXIR Analysis software integrating spectra comparison and element profiling

Main Results and Discussion

A white particle approximately 4 mm in size from a food production line was analyzed. FTIR spectra indicated proteinaceous composition with best match from library search. EDX analysis revealed primary elements calcium 68 wt percent and phosphorus 28 wt percent, consistent with calcium phosphate. Software correlation yielded a high similarity score of 0.916 identifying the contaminant as a bone fragment. Comparative visualization of spectral, elemental, and morphological data confirmed the identification.

Benefits and Practical Applications

• Accelerated contaminant identification through combined organic and inorganic analysis
• Reduced dependency on operator expertise via guided software workflows
• Improved accuracy by correlating spectral and elemental fingerprints
• Efficient sample handling using a shared sample holder

Future Trends and Potential Applications

The integration of spectroscopy and elemental analysis is expected to expand into automated quality control in food safety environmental monitoring and materials inspection. Advances in spectral libraries and machine learning algorithms will further enhance identification confidence and broaden library databases. Miniaturization of instruments may enable on site contaminant screening.

Conclusion

The combined FTIR and EDX workflow with dedicated software provides a robust and user friendly approach for rapid contaminant analysis. This method effectively identifies both organic and inorganic components offering improved accuracy and efficiency for industrial inspection and quality assurance.

References

1. Shimadzu Application News No A522A Contaminant Analysis Using EDXIR Analysis Software for Combined EDX FTIR Analysis
2. Shimadzu Application News No A527 Quantifying Silent Change Using EDXIR Analysis Software EDX FTIR Contaminant Finder Material Inspector
3. Shimadzu Application News No A537 Introducing the EDXIR Holder Sample Holder Stocker for Contaminant Measurement