Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging Application note Electronics and Semiconductor Authors Dr. Mustafa Kansiz and Dr. Kevin Grant Agilent Technologies, Mulgrave, VIC, Australia Introduction The electronics and semiconductor industries rely heavily on failure…
Key words
atr, imaging, chemical, specks, ftir, circuit, pcb, semiconductor, board, electronics, delicate, manufacturers, components, identified, identify