Optical Characteristics and Thickness of 2-layered Structures

Applications of UV-Vis-NIR Optical Characterization of Materials Using Spectroscopy Application Compendium > Return to table of contents Table of contents Introduction  4 Optics  5 Characterizing Sub-Nanometer Narrow Bandpass Filters  Evaluation of the Cary Specular Reflectance Accessory for…

Application Note Materials Optical Characterization of Thin Films Using a Universal Measurement Accessory for Agilent Cary UV-Vis-NIR spectrophotometers Authors Robert Francis and Travis Burt Agilent Technologies, Inc. Mulgrave, Victoria Australia Introduction A more detailed account of this work was first…

Application Note Materials testing and research Quality Control of Beam Splitters and Quarter-Wave-Mirrors Multi-angle UV-Vis-NIR measurements of multiple layer optical coatings Author Introduction David Death Farinaz Haq Agilent Technologies, Australia Optical coatings and coating technologies have matured over many years…

The determination of thin film thickness using reflectance spectroscopy Application Note Author Abstract Andrew R. Hind PhD* and Lisette Chomette** The reflectance spectrum of a coated polycarbonate sample was used to determine the film thickness of a polymeric coating. Absolute…