Analysis of 10 nm gold nanoparticles using the high sensitivity of the Agilent 8900 ICP-QQQ

High sensitivity analysis of SiO2 nanoparticles using the Agilent 8900 ICP-QQQ in MS/MS mode Application note Materials, environmental, food Authors Michiko Yamanaka and Takayuki Itagaki Agilent Technologies, Japan Steve Wilbur Agilent Technologies, USA Introduction Nanomaterials are increasingly used in industrial…

Application Note Semiconductor Multielement Nanoparticle Analysis of Semiconductor Process Chemicals Using spICP-QQQ Characterization of Ag, Fe3O4, Al2O3, Au, and SiO2 NPs in TMAH in a single analytical run Author Yoshinori Shimamura, Donna Hsu, and Michiko Yamanaka Agilent Technologies, Inc. Introduction…

Agilent ICP-MS Journal July 2016 – Issue 66 Inside this Issue 2-3 The New Agilent 8900 ICP-QQQ Provides Improved Performance and Enhanced Flexibility 4 Building on the Success of the Innovative Agilent 8800 ICP-QQQ 5 Characterization of Nanoparticle Content…

Application Note Energy & Fuels, Semiconductors Characterization of Iron Nanoparticles in Hydrocarbon Matrices by Single Particle (sp)ICP-MS Evaluation of Agilent 7900 spICP-MS method using solvent-compatible nanoparticle reference materials Authors Introduction Jenny Nelson Agilent Technologies, Inc., Santa Clara, CA, USA Inorganic…