ENHANCED HELIUM MODE CELL PERFORMANCE FOR IMPROVED INTERFERENCE REMOVAL IN ICP-MS

Enhanced Helium Collision Mode with Agilent ORS4 Cell Agilent ICP-MS technology brief Helium collision mode in ICP-MS Enhanced helium mode on Agilent ICP-MS systems Helium (He) mode with kinetic energy discrimination (KED) is the preferred collision/reaction cell (CRC) mode for…

PC-013 Enhancing Helium Mode Performance to Provide Improved Detection Limits for Difficult Elements Including S, P, Fe, and Se Ed McCurdy, Naoki Sugiyama and Steve Wilbur, Agilent Technologies 2011 European Winter Conference on Plasma Spectrochemistry, Zaragoza, Spain Helium (He) Collision…

White Paper Technical Overview and Performance Capability of the Agilent 7900s ICP-MS for Semiconductor Applications Introduction Agilent ICP-MS systems are widely used for accurate low-level analysis of trace contaminants across a wide range of high-purity chemicals used in the semiconductor…

Technical Overview Resolving REE2+ Overlaps on Arsenic and Selenium With Hydrogen Cell Gas Accurate analysis of As and Se in a REE matrix using Agilent single quadrupole ICP-MS Introduction ICP-MS is the technique of choice for rapid multi-element analysis of…