Application Note Pharmaceutical Elemental Impurities in Aspirin: USP <232>/<233> and ICH Q3D Methods Using ICP-OES Validation of the USP <232>/<233> method on an Agilent ICP-OES Author Lindsey Whitecotton, Greg Gilleland, Elizabeth Kulikov, and Amir Liba Agilent Technologies, Inc., USA Samina…
Key words
fitted, pass, aspirin, element, fact, elemental, wavelength, pharmaceutical, impurities, oes, icp, value, procedure, spiked, detectability