Evaluation of the Cary Absolute Specular Reflectance accessory for the measurement of optical constants of thin films

Application Note Materials Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films Author Stuart White Physics Department, Sydney University, Sydney, New South Wales Abstract The optical constants of thin absorbing films can…

Applications of UV-Vis-NIR Optical Characterization of Materials Using Spectroscopy Application Compendium > Return to table of contents Table of contents Introduction  4 Optics  5 Characterizing Sub-Nanometer Narrow Bandpass Filters  Evaluation of the Cary Specular Reflectance Accessory for…

The determination of thin film thickness using reflectance spectroscopy Application Note Author Abstract Andrew R. Hind PhD* and Lisette Chomette** The reflectance spectrum of a coated polycarbonate sample was used to determine the film thickness of a polymeric coating. Absolute…

Low reflectance measurements using the ‘VW’ technique Application Note Author Introduction Andrew R. Hind PhD and Caroline Perier Thin film anti-reflection (AR) coatings are designed to greatly reduce the light loss through the utilization of phase changes and the dependence…