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Applications - page 3
Open paper A Faster, More Accurate Way of Characterizing Cube Beamsplitters
GCMS
LCMS
ICPMS
A Faster, More Accurate Way of Characterizing Cube Beamsplitters
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Optical Characterization of Thin Films
GCMS
LCMS
ICPMS
Optical Characterization of Thin Films
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Gaining Deeper Insights into Thin Film Response
GCMS
LCMS
ICPMS
Gaining Deeper Insights into Thin Film Response
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Monitoring ferrocyanide oxidation using hyphenated EC-Raman
GCMS
LCMS
ICPMS
Monitoring ferrocyanide oxidation using hyphenated EC-Raman
RAMAN Spectroscopy, Electrochemistry
Instrumentation
RAMAN Spectroscopy, Electrochemistry
Manufacturer
Metrohm
Industries
Energy & Chemicals
Open paper LiDAR Evaluation System: Measurement of Transmittance/Reflectance of Optical Materials
GCMS
LCMS
ICPMS
LiDAR Evaluation System: Measurement of Transmittance/Reflectance of Optical Materials
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries
Materials Testing
Open paper LiDAR Evaluation System: Measurement of Transmittance of Bandpass Filters
GCMS
LCMS
ICPMS
LiDAR Evaluation System: Measurement of Transmittance of Bandpass Filters
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries
Open paper Mnova DB - MyData
GCMS
ICPMS
LCMS
Mnova DB - MyData
Software
Instrumentation
Software
Manufacturer
SciY/Mestrelab Research
Industries
Other
Open paper Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
GCMS
LCMS
ICPMS
Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Open paper Investigation of Dichroism by Spectrophotometric Methods
GCMS
LCMS
ICPMS
Investigation of Dichroism by Spectrophotometric Methods
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Solutions for Pharmaceutical Analysis - Application Notebook
GCMS
LCMS
ICPMS
Solutions for Pharmaceutical Analysis - Application Notebook
GC, GC/MSD, GC/MS/MS, HeadSpace, GC/SQ, GC/QQQ, Software, MS Imaging, HPLC, LC/MS, LC/MS/MS, LC/QQQ, GD/MP/ICP-AES
Instrumentation
GC, GC/MSD, GC/MS/MS, HeadSpace, GC/SQ, GC/QQQ, Software, MS Imaging, HPLC, LC/MS, LC/MS/MS, LC/QQQ, GD/MP/ICP-AES
Manufacturer
Shimadzu
Industries
Pharma & Biopharma
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