Applications - page 3

Open paper A Faster, More Accurate Way of Characterizing Cube Beamsplitters
GCMSLCMSICPMS

A Faster, More Accurate Way of Characterizing Cube Beamsplitters

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Optical Characterization of Thin Films
GCMSLCMSICPMS

Optical Characterization of Thin Films

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Gaining Deeper Insights into Thin Film Response
GCMSLCMSICPMS

Gaining Deeper Insights into Thin Film Response

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Monitoring ferrocyanide oxidation using hyphenated EC-Raman
GCMSLCMSICPMS

Monitoring ferrocyanide oxidation using hyphenated EC-Raman

RAMAN Spectroscopy, Electrochemistry
Instrumentation
RAMAN Spectroscopy, Electrochemistry
Manufacturer
Metrohm
Industries
Energy & Chemicals
Open paper LiDAR Evaluation System: Measurement of Transmittance/Reflectance of Optical Materials
GCMSLCMSICPMS

LiDAR Evaluation System: Measurement of Transmittance/Reflectance of Optical Materials

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries
Materials Testing
Open paper LiDAR Evaluation System: Measurement of Transmittance of Bandpass Filters
GCMSLCMSICPMS

LiDAR Evaluation System: Measurement of Transmittance of Bandpass Filters

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries
Open paper Mnova DB - MyData
GCMSICPMSLCMS

Mnova DB - MyData

Software
Instrumentation
Software
Manufacturer
SciY/Mestrelab Research
Industries
Other
Open paper Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
GCMSLCMSICPMS

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Open paper Investigation of Dichroism by Spectrophotometric Methods
GCMSLCMSICPMS

Investigation of Dichroism by Spectrophotometric Methods

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Solutions for Pharmaceutical Analysis - Application Notebook
GCMSLCMSICPMS

Solutions for Pharmaceutical Analysis - Application Notebook

GC, GC/MSD, GC/MS/MS, HeadSpace, GC/SQ, GC/QQQ, Software, MS Imaging, HPLC, LC/MS, LC/MS/MS, LC/QQQ, GD/MP/ICP-AES
Instrumentation
GC, GC/MSD, GC/MS/MS, HeadSpace, GC/SQ, GC/QQQ, Software, MS Imaging, HPLC, LC/MS, LC/MS/MS, LC/QQQ, GD/MP/ICP-AES
Manufacturer
Shimadzu
Industries
Pharma & Biopharma