Applications focused on NIR Spectroscopy - page 1

Open paper Improving Spectral Quality Using Beam Collimation Control
GCMSICPMSLCMS

Improving Spectral Quality Using Beam Collimation Control

Technical notes
| 2024 | Agilent Technologies
UV–VIS spectrophotometry, NIR Spectroscopy
Instrumentation
UV–VIS spectrophotometry, NIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Compatibility of Vision Air versions with Windows operating systems
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Compatibility of Vision Air versions with Windows operating systems

Technical notes
| 2022 | Metrohm
Software, NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
Software, NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Metrohm
Industries
Open paper Unattended, Automated Measurements of Optical Components in a Production Environment
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Unattended, Automated Measurements of Optical Components in a Production Environment

Technical notes
| 2018 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Agilent Cary Universal Measurement Accessory (UMA)
GCMSLCMSICPMS

Agilent Cary Universal Measurement Accessory (UMA)

Technical notes
| 2013 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Open paper Comparing the limiting resolution of the Agilent Cary 5000 and Cary 6000i UVVis-NIR spectrophotometers using the transmission spectrum of water vapor
GCMSLCMSICPMS

Comparing the limiting resolution of the Agilent Cary 5000 and Cary 6000i UVVis-NIR spectrophotometers using the transmission spectrum of water vapor

Technical notes
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Open paper Low reflectance measurements using the ‘VW’ technique
GCMSLCMSICPMS

Low reflectance measurements using the ‘VW’ technique

Technical notes
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Open paper Introduction of Variable Angle Absolute Reflectance Attachment for the SolidSpec-3700
GCMSLCMSICPMS

Introduction of Variable Angle Absolute Reflectance Attachment for the SolidSpec-3700

Technical notes
| N/A | Shimadzu
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries
Open paper OMNIS NIRS: An efficiency boost for your laboratory
GCMSICPMS

OMNIS NIRS: An efficiency boost for your laboratory

Technical notes
| 2024 | Metrohm
NIR Spectroscopy, Software
Instrumentation
NIR Spectroscopy, Software
Manufacturer
Metrohm
Industries
Other
Open paper Evaluation of Photometric Accuracy in the Near Infrared Region Using Metal-on-Quartz Filters
GCMSICPMS

Evaluation of Photometric Accuracy in the Near Infrared Region Using Metal-on-Quartz Filters

Technical notes
| 2022 | Agilent Technologies
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Open paper Effects of Filter Composition, Spectral Bandwidth, and Pathlength on Stray Light Levels in the Near-Infrared Region
GCMSICPMS

Effects of Filter Composition, Spectral Bandwidth, and Pathlength on Stray Light Levels in the Near-Infrared Region

Technical notes
| 2022 | Agilent Technologies
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Agilent Technologies
Industries