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Applications from the field of Materials Testing - page 1
Open paper Improving Spectral Quality Using Beam Collimation Control
GCMS
ICPMS
LCMS
Improving Spectral Quality Using Beam Collimation Control
UV–VIS spectrophotometry, NIR Spectroscopy
Instrumentation
UV–VIS spectrophotometry, NIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper High Temperature Dehydration Studies Using UV-Vis-NIR Diffuse Reflectance Spectroscopy
GCMS
LCMS
ICPMS
High Temperature Dehydration Studies Using UV-Vis-NIR Diffuse Reflectance Spectroscopy
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films
GCMS
LCMS
ICPMS
Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR
GCMS
LCMS
ICPMS
Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Measuring the Optical Properties of Photovoltaic Cells
GCMS
LCMS
ICPMS
Measuring the Optical Properties of Photovoltaic Cells
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Measurement of Diffuse Reflection from Catalyst Powders
GCMS
LCMS
ICPMS
Measurement of Diffuse Reflection from Catalyst Powders
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Optical Characterization of Materials Using Spectroscopy
GCMS
LCMS
ICPMS
Optical Characterization of Materials Using Spectroscopy
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Materials Testing, Semiconductor Analysis
Open paper A Faster, More Accurate Way of Characterizing Cube Beamsplitters
GCMS
LCMS
ICPMS
A Faster, More Accurate Way of Characterizing Cube Beamsplitters
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Optical Characterization of Thin Films
GCMS
LCMS
ICPMS
Optical Characterization of Thin Films
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Gaining Deeper Insights into Thin Film Response
GCMS
LCMS
ICPMS
Gaining Deeper Insights into Thin Film Response
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
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