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Applications from the field of Materials Testing from Agilent Technologies - page 11
Open paper Measuring the UV protection factor (UPF) of fabrics and clothing
LCMS
ICPMS
Measuring the UV protection factor (UPF) of fabrics and clothing
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Characterizing sub-nanometer narrow bandpass filters using a Cary 400/500
LCMS
ICPMS
Characterizing sub-nanometer narrow bandpass filters using a Cary 400/500
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory
LCMS
ICPMS
The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper The deep ultraviolet spectroscopic properties of a next-generation photoresist
LCMS
ICPMS
The deep ultraviolet spectroscopic properties of a next-generation photoresist
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Open paper Quantitative analysis of tint in polymer pellets and disks
LCMS
ICPMS
Quantitative analysis of tint in polymer pellets and disks
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Measuring optical filters
LCMS
ICPMS
Measuring optical filters
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Measuring the cover and shade protection factors of synthetic shadecloth
LCMS
ICPMS
Measuring the cover and shade protection factors of synthetic shadecloth
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper The determination of thin film thickness using reflectance spectroscopy
LCMS
ICPMS
The determination of thin film thickness using reflectance spectroscopy
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Analysis of High Purity Titanium Using an Agilent 9500 ICP-QQQ
ICPMS
Analysis of High Purity Titanium Using an Agilent 9500 ICP-QQQ
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Improving Resolution of Single Nanoparticles Using ICP-MS and Shorter Dwell Times
ICPMS
Improving Resolution of Single Nanoparticles Using ICP-MS and Shorter Dwell Times
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Materials Testing
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