Applications from the field of Materials Testing from Agilent Technologies - page 11

Open paper Measuring the UV protection factor (UPF) of fabrics and clothing
LCMSICPMS

Measuring the UV protection factor (UPF) of fabrics and clothing

UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Characterizing sub-nanometer narrow bandpass filters using a Cary 400/500
LCMSICPMS

Characterizing sub-nanometer narrow bandpass filters using a Cary 400/500

UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory
LCMSICPMS

The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory

UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper The deep ultraviolet spectroscopic properties of a next-generation photoresist
LCMSICPMS

The deep ultraviolet spectroscopic properties of a next-generation photoresist

UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Open paper Quantitative analysis of tint in polymer pellets and disks
LCMSICPMS

Quantitative analysis of tint in polymer pellets and disks

UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Measuring optical filters
LCMSICPMS

Measuring optical filters

UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Measuring the cover and shade protection factors of synthetic shadecloth
LCMSICPMS

Measuring the cover and shade protection factors of synthetic shadecloth

UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper The determination of thin film thickness using reflectance spectroscopy
LCMSICPMS

The determination of thin film thickness using reflectance spectroscopy

UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Analysis of High Purity Titanium Using an Agilent 9500 ICP-QQQ
ICPMS

Analysis of High Purity Titanium Using an Agilent 9500 ICP-QQQ

ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Improving Resolution of Single Nanoparticles Using ICP-MS and Shorter Dwell Times
ICPMS

Improving Resolution of Single Nanoparticles Using ICP-MS and Shorter Dwell Times

ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Materials Testing