Applications from the field of Semiconductor Analysis - page 3

Open paper Measuring Inorganic Impurities in Semiconductor Manufacturing
GCMSICPMS

Measuring Inorganic Impurities in Semiconductor Manufacturing

Guides
| 2022 | Agilent Technologies
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Quality Control of Laminates
GCMSICPMS

Quality Control of Laminates

Applications
| 2021 | Metrohm
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Metrohm
Industries
Semiconductor Analysis
Open paper Quality control of semiconductor acid baths as per ASTM E1655 – Time- and cost-efficient with NIRS
GCMSICPMS

Quality control of semiconductor acid baths as per ASTM E1655 – Time- and cost-efficient with NIRS

Technical notes
| 2021 | Metrohm
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Metrohm
Industries
Semiconductor Analysis
Open paper Analysis of a CMOS Chip Circuit Board using the stand-alone FTIR Microscope LUMOS II
GCMSICPMS

Analysis of a CMOS Chip Circuit Board using the stand-alone FTIR Microscope LUMOS II

Applications
| 2021 | Bruker Optics
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Semiconductor Analysis
Open paper Carbon and Oxygen Quantification in Silicon wafers
GCMSICPMS

Carbon and Oxygen Quantification in Silicon wafers

Applications
| 2021 | Bruker Optics
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Semiconductor Analysis
Open paper Infrared Photoluminescence Spectroscopy
GCMSICPMS

Infrared Photoluminescence Spectroscopy

Applications
| 2021 | Bruker Optics
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Materials Testing, Semiconductor Analysis
Open paper Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ
GCMSICPMS

Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

Applications
| 2020 | Agilent Technologies
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ
GCMSICPMS

Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ

Applications
| 2016 | Agilent Technologies
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Open paper Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ
GCMSICPMS

Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ

Applications
| 2015 | Agilent Technologies
GC, Speciation analysis, ICP/MS/MS
Instrumentation
GC, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Open paper Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging
GCMSICPMS

Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

Applications
| 2014 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis