Applications from the field of Semiconductor Analysis from Agilent Technologies - page 1

Open paper A Practical Guide for Understanding and Testing Hazardous Substances in Electrical and Electronic Products
LCMSGCMSICPMS

A Practical Guide for Understanding and Testing Hazardous Substances in Electrical and Electronic Products

GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy
Instrumentation
GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Optical Characterization of Materials Using Spectroscopy
GCMSLCMSICPMS

Optical Characterization of Materials Using Spectroscopy

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Materials Testing, Semiconductor Analysis
Open paper Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900
GCMSLCMSICPMS

Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900

GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies, Elemental Scientific
Industries
Environmental, Food & Agriculture, Energy & Chemicals , Pharma & Biopharma, Materials Testing, Semiconductor Analysis , Clinical Research
Open paper Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
GCMSLCMSICPMS

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Open paper Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500
GCMSLCMSICPMS

Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Open paper Measuring Inorganic Impurities in Semiconductor Manufacturing
GCMSICPMS

Measuring Inorganic Impurities in Semiconductor Manufacturing

GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ
GCMSICPMS

Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ
GCMSICPMS

Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ

GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Open paper Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ
GCMSICPMS

Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ

GC, Speciation analysis, ICP/MS/MS
Instrumentation
GC, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Open paper Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging
GCMSICPMS

Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis