Applications from the field of Semiconductor Analysis focused on FTIR Spectroscopy - page 2

Open paper Evaluation of Surface Carbon on Lithium-Ion Battery Cathode Active Materials Using a TOC Analyzer and Infrared/Raman Microscope
ICPMSGCMS

Evaluation of Surface Carbon on Lithium-Ion Battery Cathode Active Materials Using a TOC Analyzer and Infrared/Raman Microscope

Applications
| 2026 | Shimadzu
RAMAN Spectroscopy, TOC, FTIR Spectroscopy
Instrumentation
RAMAN Spectroscopy, TOC, FTIR Spectroscopy
Manufacturer
Shimadzu
Industries
Semiconductor Analysis
Open paper Carbon and Oxygen Quantification in Silicon wafers
GCMSICPMS

Carbon and Oxygen Quantification in Silicon wafers

Applications
| 2021 | Bruker Optics
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Semiconductor Analysis
Open paper Analysis of a CMOS Chip Circuit Board using the stand-alone FTIR Microscope LUMOS II
GCMSICPMS

Analysis of a CMOS Chip Circuit Board using the stand-alone FTIR Microscope LUMOS II

Applications
| 2021 | Bruker Optics
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Semiconductor Analysis
Open paper Infrared Photoluminescence Spectroscopy
GCMSICPMS

Infrared Photoluminescence Spectroscopy

Applications
| 2021 | Bruker Optics
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Materials Testing, Semiconductor Analysis
Open paper Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging
GCMSICPMS

Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

Applications
| 2014 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Open paper Equipment Used in Semiconductor Manufacturing Processes and Evaluation Examples
GCMS

Equipment Used in Semiconductor Manufacturing Processes and Evaluation Examples

Brochures and specifications
| 2025 | Shimadzu
GC/MSD, TOC, LC/MS, LC/MS/MS, LC/QQQ, GC/SQ, Microscopy, FTIR Spectroscopy, X-ray, Mechanical testing, HPLC, Elemental Analysis, UV–VIS spectrophotometry
Instrumentation
GC/MSD, TOC, LC/MS, LC/MS/MS, LC/QQQ, GC/SQ, Microscopy, FTIR Spectroscopy, X-ray, Mechanical testing, HPLC, Elemental Analysis, UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries
Semiconductor Analysis
Open paper Measuring destruction efficiency of greenhouse gases released by semiconductor fabrication tools
GCMS

Measuring destruction efficiency of greenhouse gases released by semiconductor fabrication tools

Applications
| 2023 | Thermo Fisher Scientific
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis