Applications from the field of Semiconductor Analysis focused on ICP/MS from Agilent Technologies - page 1

Open paper A Practical Guide for Understanding and Testing Hazardous Substances in Electrical and Electronic Products
LCMSGCMSICPMS

A Practical Guide for Understanding and Testing Hazardous Substances in Electrical and Electronic Products

GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy
Instrumentation
GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900
GCMSLCMSICPMS

Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900

GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies, Elemental Scientific
Industries
Environmental, Food & Agriculture, Energy & Chemicals , Pharma & Biopharma, Materials Testing, Semiconductor Analysis , Clinical Research
Open paper Measuring Inorganic Impurities in Semiconductor Manufacturing
GCMSICPMS

Measuring Inorganic Impurities in Semiconductor Manufacturing

GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ
GCMSICPMS

Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ
GCMSICPMS

Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ

GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Open paper Agilent ICP-MS Journal (November 2021, Issue 86)
LCMSICPMS

Agilent ICP-MS Journal (November 2021, Issue 86)

Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS
Instrumentation
Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies, Metrohm, CEM
Industries
Environmental, Food & Agriculture, Semiconductor Analysis
Open paper Agilent ICP-MS Journal (October 2020, Issue 82)
LCMSICPMS

Agilent ICP-MS Journal (October 2020, Issue 82)

HPLC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
HPLC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Food & Agriculture, Energy & Chemicals , Semiconductor Analysis
Open paper Agilent 9500 ICP‑QQQ with m‑Lens for Ultratrace Analysis of High‑Purity Reagents
ICPMS

Agilent 9500 ICP‑QQQ with m‑Lens for Ultratrace Analysis of High‑Purity Reagents

ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Consumable Solutions for Semiconductor Analysis
ICPMS

Consumable Solutions for Semiconductor Analysis

ICP/MS/MS, ICP/MS
Instrumentation
ICP/MS/MS, ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Trace Elemental Analysis of Precursor Materials Using ICP-MS/MS
ICPMS

Trace Elemental Analysis of Precursor Materials Using ICP-MS/MS

ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis