Applications from the field of Semiconductor Analysis focused on GC/MSD - page 2
Open paper Equipment Used in Semiconductor Manufacturing Processes and Evaluation Examples
GCMS
Equipment Used in Semiconductor Manufacturing Processes and Evaluation Examples
GC/MSD, TOC, LC/MS, LC/MS/MS, LC/QQQ, GC/SQ, Microscopy, FTIR Spectroscopy, X-ray, Mechanical testing, HPLC, Elemental Analysis, UV–VIS spectrophotometry
Instrumentation
GC/MSD, TOC, LC/MS, LC/MS/MS, LC/QQQ, GC/SQ, Microscopy, FTIR Spectroscopy, X-ray, Mechanical testing, HPLC, Elemental Analysis, UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries
Semiconductor Analysis
Open paper Analysis of 65 Volatile Organic Compounds in Ambient Air by Canister Sampling Using an Agilent 8890/5977 GC/MSD
GCMS
Analysis of 65 Volatile Organic Compounds in Ambient Air by Canister Sampling Using an Agilent 8890/5977 GC/MSD
GC/MSD, GC/SQ
Instrumentation
GC/MSD, GC/SQ
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Analysis of electrolyte components of lithium-ion batteries using gas chromatography-mass spectrometry
GCMS
Analysis of electrolyte components of lithium-ion batteries using gas chromatography-mass spectrometry
GC/MSD, GC/SQ
Instrumentation
GC/MSD, GC/SQ
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
Open paper UV Degradation Analysis of Material for Solar Cell Modules Using GC/MS and FTIR
GCMS
UV Degradation Analysis of Material for Solar Cell Modules Using GC/MS and FTIR
GC/MSD, Pyrolysis, GC/SQ
Instrumentation
GC/MSD, Pyrolysis, GC/SQ
Manufacturer
Shimadzu, Frontier Lab
Industries
Materials Testing, Semiconductor Analysis
Open paper Py-GC/MS Analysis of Electronic Circuit Board Parts Using Nitrogen Carrier Gas
GCMS
Py-GC/MS Analysis of Electronic Circuit Board Parts Using Nitrogen Carrier Gas
GC/MSD, Pyrolysis, GC/SQ
Instrumentation
GC/MSD, Pyrolysis, GC/SQ
Manufacturer
Shimadzu, Frontier Lab
Industries
Semiconductor Analysis
Open paper The power of exact mass measurement: an example of unknown compound identification
GCMS
The power of exact mass measurement: an example of unknown compound identification
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
Agilent Technologies, JEOL
Industries
Materials Testing, Semiconductor Analysis
Open paper Detection of molecular ions from OLED material using AccuTOF GC
GCMS
Detection of molecular ions from OLED material using AccuTOF GC
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
JEOL
Industries
Materials Testing, Semiconductor Analysis
Open paper The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste
GCMS
The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Manufacturer
JEOL, ZOEX/JSB
Industries
Materials Testing, Semiconductor Analysis
Open paper Phthalate Analysis in Accordance with an IEC Standard Method
GCMS
Phthalate Analysis in Accordance with an IEC Standard Method
GC/MSD, Pyrolysis
Instrumentation
GC/MSD, Pyrolysis
Manufacturer
CDS Analytical
Industries
Semiconductor Analysis
