In Situ Analysis of Inorganic and Organometallic Clusters

APPLICATION NOTE Depth Profiling of an Organic FET with XPS and Argon Cluster Ions Author Paul Mack, Andy Wright, Thermo Fisher Scientific, East Grinstead, West Sussex, UK The Thermo Scientific™ Nexsa™ XPS instrument, with the Thermo Scientific™ MAGCIS™ dual mode…

APPLICATION NOTE AN52476 Confirming the layer structure of an organic FET device Authors Paul Mack Thermo Fisher Scientific East Grinstead, West Sussex, UK Key Words MAGCIS, XPS, Argon Clusters, CuPc, Depth Profiling, Organic Electronics, Polymer Electronics FET, Nexsa The Thermo…

Evaluation of Organometallic Compounds using GC/Q-TOF with a Novel Soft Ionization Source ASMS 2016 WP281 Jennifer Sanderson and David Kaz, Agilent Technologies, Inc. Santa Clara, CA Introduction Organometallics synthesized from transition metals are a versatile class of compounds that are…

CUSTOMER APPLICATION NOTE 73761 Impurity analysis of L-aspartic acid and glycine by HPLC-UV-CAD Authors: Ruben Pawellek, Adrian Leistner, Ulrike Holzgrabe University of Wuerzburg, Germany Keywords: Amino acids, impurity analysis, ion pair chromatography, Vanquish Horizon Charged Aerosol Detector, Variable Wavelength Detector…