Confirming the layer structure of an organic FET device

APPLICATION NOTE Depth Profiling of an Organic FET with XPS and Argon Cluster Ions Author Paul Mack, Andy Wright, Thermo Fisher Scientific, East Grinstead, West Sussex, UK The Thermo Scientific™ Nexsa™ XPS instrument, with the Thermo Scientific™ MAGCIS™ dual mode…

Exploring the surface in depth with XPS analysis Depth profiling of surfaces and interfaces with the Hypulse Surface Analysis System The need for surface and interface analysis In today’s rapidly evolving technological landscape, precise material analysis is crucial for the…

Instrumentation for surface analysis Surface chemistry and thin film characterization X-ray photoelectron spectroscopy Quantitative, chemical identification of the surface X-ray Photoelectron Spectroscopy (XPS, also known as Electron Spectroscopy for Chemical Analysis – ESCA) is a highly surface-sensitive, quantitative, chemical analysis…

Christopher Deeks, Paul Mack, Thermo Fisher Scientific, East Grinstead, UK Appli cat i on N ote 5 2 6 0 6 Cleaning Metal Oxides Using Argon Cluster Ions to Prevent Surface Modification Key Words XPS, MAGCIS, Argon Clusters, Cleaning, Metal…