Agilent ICP-MS Journal (November 2022, Issue 90)

Application Note Semiconductor Elemental and Particle Analysis of N-Methyl-2-Pyrrolidone (NMP) by ICP-MS/MS Analysis of dissolved and particulate inorganic impurities in two grades of NMP using the Agilent 8900 ICP-QQQ Author Introduction Yoshinori Shimamura Ideally, analytical quality control (QC) testing procedures…

Yoshinori Shimamuraand Satoshi Kondo Particle Analysis of Two High Purity Grades of N-Methyl-2Pyrrolidone (NMP) using Single Particle (sp)ICP-MS/MS Method Agilent Technologies, Inc., Tokyo, Japan Sample analysis performed in collaboration with Kakeru Usuba, Naoki Katano, and Takao Shibasaki EWCPS 2023 Th…

Applications of ICP-MS Measuring Inorganic Impurities in Semiconductor Manufacturing Application Compendium > Return to table of contents > Search entire document Table of contents ICP-MS and ICP-QQQ in the Semiconductor Industry 4 Agilent Has Three Decades of ICP-MS Experience Driving…

Leave Interferences Behind With MS/MS. Agilent 8900 Triple Quadrupole ICP-MS Put Your ICP-MS Results Beyond Doubt Reliable interference removal is easier to achieve with the 2nd generation Agilent 8900 ICP-QQQ. In 2012, Agilent released the Agilent 8800, the world’s first…