Low reflectance measurements using the ‘VW’ technique

The determination of thin film thickness using reflectance spectroscopy Application Note Author Abstract Andrew R. Hind PhD* and Lisette Chomette** The reflectance spectrum of a coated polycarbonate sample was used to determine the film thickness of a polymeric coating. Absolute…

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The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory Application Note Author Andrew R. Hind PhD Abstract Agilent Technologies, Inc. Deep UV spectra of magnesium fluoride coated optical components have been acquired using…

The deep ultraviolet spectroscopic properties of a next-generation photoresist Application Note Author Abstract Andrew R. Hind PhD and Rina Soebekti The deep UV spectroscopic properties of a next-generation photoresist material have been investigated using a Cary Deep UV spectrophotometer equipped…