Using GC/MSD with High Efficiency Source and JetClean to detect low level contaminants in ethylene and propylene

Using GC/MSD with High Efficiency Source and Hydrogen Cleaning to detect low level contaminants in ethylene and propylene Angela Smith Henry1 ([email protected]), Bruce D. Quimby1 ([email protected]), Badr Astiphan2 ([email protected]), 1Agilent Technologies, 2850 Centerville Road, Wilmington, DE 19808, USA; 2Agilent Technologies,…

CONTAMINANTS IN ETHYLENE AND PROPYLENE ULTRA TRACE LEVEL DETECTION Technology Advantage: Agilent HES and Agilent JetClean Self‑Cleaning Ion Source Introduction Developments with metallocene catalysts have increased productivity for the polymerization of ethylene and propylene; however, these catalysts can also be…

Analysis of Arsine and Phosphine in Ethylene and Propylene Using the Agilent Arsine Phosphine GC/MS Analyzer with a High Efficiency Source Application Note Petrochemical Authors Abstract Angela Smith Henry and Bruce Quimby The Agilent Arsine Phosphine GC/MS analyzer enables detection…

Dual-Channel Gas Chromatographic System for the Determination of Low-Level Sulfur in Hydrocarbon Gases Application Hydrocarbon Processing Authors Roger L. Firor and Bruce D. Quimby Agilent Technologies, Inc. 2850 Centerville Road Wilmington, DE 19808 USA Abstract A 6890N equipped with dual…