9500 Library - page 10
Open paper Characterization of Silicon Oxide and Oxynitride Layers
Characterization of Silicon Oxide and Oxynitride Layers
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Open paper FT-NIR Analysis of Wine
FT-NIR Analysis of Wine
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Thermo Fisher Scientific
Industries
Food & Agriculture
Open paper High Precision Strontium and Neodymium Isotope Analyses
High Precision Strontium and Neodymium Isotope Analyses
Elemental Analysis, GC/HRMS, GC/MSD
Instrumentation
Elemental Analysis, GC/HRMS, GC/MSD
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals
Open paper Analysis of clinker phases with the Thermo Scientific ARL 9900 Total Cement Analyzer X-ray fluorescence system with compact XRD
Analysis of clinker phases with the Thermo Scientific ARL 9900 Total Cement Analyzer X-ray fluorescence system with compact XRD
X-ray, XRD
Instrumentation
X-ray, XRD
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals
Open paper Studying nickel deposition with EQCM-D and EC-Raman
Studying nickel deposition with EQCM-D and EC-Raman
RAMAN Spectroscopy, Electrochemistry, Voltammetry/Coulometry
Instrumentation
RAMAN Spectroscopy, Electrochemistry, Voltammetry/Coulometry
Manufacturer
Metrohm
Industries
Semiconductor Analysis
Open paper SOLAAR Software for Thermo Scientific iCE 3000 Series AA Spectrometers
SOLAAR Software for Thermo Scientific iCE 3000 Series AA Spectrometers
AAS
Instrumentation
AAS
Manufacturer
Thermo Fisher Scientific
Industries
Open paper REACH Compliance with Near-infrared and Raman Spectroscopy Tools
REACH Compliance with Near-infrared and Raman Spectroscopy Tools
NIR Spectroscopy, RAMAN Spectroscopy
Instrumentation
NIR Spectroscopy, RAMAN Spectroscopy
Manufacturer
Thermo Fisher Scientific
Industries
Other
Open paper Characterization of High-k Dielectric Materials on Silicon Using Angle Resolved XPS
Characterization of High-k Dielectric Materials on Silicon Using Angle Resolved XPS
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Open paper Unattended Analysis of Multiple Insulating Samples
Unattended Analysis of Multiple Insulating Samples
X-ray, Software
Instrumentation
X-ray, Software
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Open paper Nondestructive Thickness Determination of Coatings and Layers from Sub-micron to Tens of Microns Using Step-Scan FT-IR Photoacoustic Phase Spectroscopy
Nondestructive Thickness Determination of Coatings and Layers from Sub-micron to Tens of Microns Using Step-Scan FT-IR Photoacoustic Phase Spectroscopy
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
