9500 Applications from the field of Materials Testing - page 4
Open paper Multiplying Productivity: The Nicolet iZ10 Module
Multiplying Productivity: The Nicolet iZ10 Module
FTIR Spectroscopy, NIR Spectroscopy
Instrumentation
FTIR Spectroscopy, NIR Spectroscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Open paper Microscope Mapping on Formulated Pharmaceutical Samples Using the Dispersive Raman Technique
Microscope Mapping on Formulated Pharmaceutical Samples Using the Dispersive Raman Technique
RAMAN Spectroscopy, Microscopy
Instrumentation
RAMAN Spectroscopy, Microscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Open paper WDXRF as an Investigative and Analytical Tool using Small Spot/Mapping and Thermo Scientific UniQuant
WDXRF as an Investigative and Analytical Tool using Small Spot/Mapping and Thermo Scientific UniQuant
X-ray, Software
Instrumentation
X-ray, Software
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals , Materials Testing
Open paper Raman Mapping of Single-walled Carbon Nanotube Distribution on Phase Separated Polystyrene and Polymethylmethacrylate
Raman Mapping of Single-walled Carbon Nanotube Distribution on Phase Separated Polystyrene and Polymethylmethacrylate
RAMAN Spectroscopy, Microscopy
Instrumentation
RAMAN Spectroscopy, Microscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Open paper Characterization of Amorphous and Microcrystalline Silicon using Raman Spectroscopy
Characterization of Amorphous and Microcrystalline Silicon using Raman Spectroscopy
RAMAN Spectroscopy, Microscopy
Instrumentation
RAMAN Spectroscopy, Microscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing, Semiconductor Analysis
Open paper Characterization of Silicon Oxide and Oxynitride Layers
Characterization of Silicon Oxide and Oxynitride Layers
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Open paper Characterization of High-k Dielectric Materials on Silicon Using Angle Resolved XPS
Characterization of High-k Dielectric Materials on Silicon Using Angle Resolved XPS
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Open paper Unattended Analysis of Multiple Insulating Samples
Unattended Analysis of Multiple Insulating Samples
X-ray, Software
Instrumentation
X-ray, Software
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Open paper Nondestructive Thickness Determination of Coatings and Layers from Sub-micron to Tens of Microns Using Step-Scan FT-IR Photoacoustic Phase Spectroscopy
Nondestructive Thickness Determination of Coatings and Layers from Sub-micron to Tens of Microns Using Step-Scan FT-IR Photoacoustic Phase Spectroscopy
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Open paper Measuring Diamond-like Carbon Films by Dispersive Raman Spectroscopy
Measuring Diamond-like Carbon Films by Dispersive Raman Spectroscopy
RAMAN Spectroscopy, Microscopy
Instrumentation
RAMAN Spectroscopy, Microscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
