Applications from the field of Materials Testing from Agilent Technologies - page 3
Open paper Cosmetic Raw Material Identification Testing Through Transparent and Opaque Containers
Cosmetic Raw Material Identification Testing Through Transparent and Opaque Containers
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Determination of Band Gap in Metal Oxides Using UV-Vis Spectroscopy
Determination of Band Gap in Metal Oxides Using UV-Vis Spectroscopy
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper High Temperature Dehydration Studies Using UV-Vis-NIR Diffuse Reflectance Spectroscopy
High Temperature Dehydration Studies Using UV-Vis-NIR Diffuse Reflectance Spectroscopy
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Material Identification of Plastics Throughout Their Life Cycle by FTIR Spectroscopy
Material Identification of Plastics Throughout Their Life Cycle by FTIR Spectroscopy
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Non-Destructive Analysis of Substrates and Contaminants by FTIR with Specular Reflectance Interface
Non-Destructive Analysis of Substrates and Contaminants by FTIR with Specular Reflectance Interface
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films
Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR
Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Measuring the Optical Properties of Photovoltaic Cells
Measuring the Optical Properties of Photovoltaic Cells
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Open paper Determination of Elemental Impurities in Silicon-Carbon Anode Materials for Lithium-Ion Batteries by ICP-OES
Determination of Elemental Impurities in Silicon-Carbon Anode Materials for Lithium-Ion Batteries by ICP-OES
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Materials Testing
Open paper Determination of Metals in Recycled Li-ion Battery Samples by ICP-OES
Determination of Metals in Recycled Li-ion Battery Samples by ICP-OES
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Materials Testing
