Applications from the field of Semiconductor Analysis - page 9
Open paper Direct Analysis of Trace Metal Impurities in High Purity Nitric Acid Using ICP-QQQ
Direct Analysis of Trace Metal Impurities in High Purity Nitric Acid Using ICP-QQQ
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Automated Analysis of Semiconductor Grade Hydrogen Peroxide and DI Water using ICP-QQQ
Automated Analysis of Semiconductor Grade Hydrogen Peroxide and DI Water using ICP-QQQ
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Analysis of Ultratrace Impurities in High Purity Copper using the Agilent 8900 ICP-QQQ
Analysis of Ultratrace Impurities in High Purity Copper using the Agilent 8900 ICP-QQQ
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Open paper Ultra-low level determination of phosphorus, sulfur, silicon and chlorine using the Agilent 8900 ICP-QQQ
Ultra-low level determination of phosphorus, sulfur, silicon and chlorine using the Agilent 8900 ICP-QQQ
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Determination of trace elements in ultrapure semiconductor grade sulfuric acid using the Agilent 8900 ICP-QQQ in MS/MS mode
Determination of trace elements in ultrapure semiconductor grade sulfuric acid using the Agilent 8900 ICP-QQQ in MS/MS mode
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Agilent ICP-MS Journal (April 2018. Issue 72)
Agilent ICP-MS Journal (April 2018. Issue 72)
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture, Semiconductor Analysis
Open paper WCPS: Accurate determination of Eu, and Sm in ultra-pure barium carbonate materials by ICP-QQQ
WCPS: Accurate determination of Eu, and Sm in ultra-pure barium carbonate materials by ICP-QQQ
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Open paper Determination of ultratrace elements in semiconductor grade Isopropyl Alcohol using the Thermo Scientific iCAP RQ ICP-MS
Determination of ultratrace elements in semiconductor grade Isopropyl Alcohol using the Thermo Scientific iCAP RQ ICP-MS
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
Open paper Routine determination of ultratrace elements in semiconductor grade nitric acid by the Thermo Scientific iCAP RQ ICP-MS
Routine determination of ultratrace elements in semiconductor grade nitric acid by the Thermo Scientific iCAP RQ ICP-MS
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
Open paper Determination of ultratrace elements in semiconductor grade sulfuric acid using the Thermo Scientific iCAP RQ ICP-MS
Determination of ultratrace elements in semiconductor grade sulfuric acid using the Thermo Scientific iCAP RQ ICP-MS
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
