Applications from the field of Semiconductor Analysis - page 10
Open paper Analysis of Trace Metal Impurities in High Purity Hydrochloric Acid Using ICP-QQQ
Analysis of Trace Metal Impurities in High Purity Hydrochloric Acid Using ICP-QQQ
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS
Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper WCPS: Accurate determination of Eu, and Sm in ultra-pure barium carbonate materials by ICP-QQQ
WCPS: Accurate determination of Eu, and Sm in ultra-pure barium carbonate materials by ICP-QQQ
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Open paper Agilent ICP-MS Journal (December 2016 – Issue 67)
Agilent ICP-MS Journal (December 2016 – Issue 67)
ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Semiconductor Analysis
Open paper Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ
Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Open paper Determination of ultra trace elements in high purity hydrogen peroxide with Agilent 8900 ICP-QQQ
Determination of ultra trace elements in high purity hydrogen peroxide with Agilent 8900 ICP-QQQ
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ
Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ
GC, Speciation analysis, ICP/MS/MS
Instrumentation
GC, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Open paper Determination of challenging elements in ultrapure semiconductor grade sulfuric acid by Triple Quadrupole ICP-MS
Determination of challenging elements in ultrapure semiconductor grade sulfuric acid by Triple Quadrupole ICP-MS
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Quantitative analysis of high purity metals using laser ablation coupled to an Agilent 7900 ICP-MS
Quantitative analysis of high purity metals using laser ablation coupled to an Agilent 7900 ICP-MS
ICP/MS, Laser ablation
Instrumentation
ICP/MS, Laser ablation
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Open paper Ultra trace measurement of potassium and other elements in ultrapure water using the Agilent 8800 ICP-QQQ in cool plasma reaction cell mode
Ultra trace measurement of potassium and other elements in ultrapure water using the Agilent 8800 ICP-QQQ in cool plasma reaction cell mode
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
