Applications from the field of Semiconductor Analysis from Agilent Technologies - page 6
Open paper Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ
Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ
GC, Speciation analysis, ICP/MS/MS
Instrumentation
GC, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Open paper Determination of challenging elements in ultrapure semiconductor grade sulfuric acid by Triple Quadrupole ICP-MS
Determination of challenging elements in ultrapure semiconductor grade sulfuric acid by Triple Quadrupole ICP-MS
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Quantitative analysis of high purity metals using laser ablation coupled to an Agilent 7900 ICP-MS
Quantitative analysis of high purity metals using laser ablation coupled to an Agilent 7900 ICP-MS
ICP/MS, Laser ablation
Instrumentation
ICP/MS, Laser ablation
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Open paper Ultra trace measurement of potassium and other elements in ultrapure water using the Agilent 8800 ICP-QQQ in cool plasma reaction cell mode
Ultra trace measurement of potassium and other elements in ultrapure water using the Agilent 8800 ICP-QQQ in cool plasma reaction cell mode
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging
Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Open paper Improvement of ICP-MS detectability of phosphorus and titanium in high purity silicon samples using the Agilent 8800 Triple Quadrupole ICP-MS
Improvement of ICP-MS detectability of phosphorus and titanium in high purity silicon samples using the Agilent 8800 Triple Quadrupole ICP-MS
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Agilent ICP-MS Journal (March 2012 – Issue 49)
Agilent ICP-MS Journal (March 2012 – Issue 49)
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Open paper Ultratrace measurement of calcium in ultrapure water using the Agilent 8800 Triple Quadrupole ICP-MS
Ultratrace measurement of calcium in ultrapure water using the Agilent 8800 Triple Quadrupole ICP-MS
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper WCPS: AGILENT 8800 TRIPLE QUADRUPOLE ICP-MS WINTER PLASMA CONFERENCE 2012 POSTERS
WCPS: AGILENT 8800 TRIPLE QUADRUPOLE ICP-MS WINTER PLASMA CONFERENCE 2012 POSTERS
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Semiconductor Analysis
Open paper Analysis of silicon, phosphorus and sulfur in 20% methanol using the Agilent 8800 Triple Quadrupole ICP-MS
Analysis of silicon, phosphorus and sulfur in 20% methanol using the Agilent 8800 Triple Quadrupole ICP-MS
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
