Applications from the field of Semiconductor Analysis from Agilent Technologies - page 1
Open paper A Practical Guide for Understanding and Testing Hazardous Substances in Electrical and Electronic Products
A Practical Guide for Understanding and Testing Hazardous Substances in Electrical and Electronic Products
GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy
Instrumentation
GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Agilent 9500 ICP‑QQQ with m‑Lens for Ultratrace Analysis of High‑Purity Reagents
Agilent 9500 ICP‑QQQ with m‑Lens for Ultratrace Analysis of High‑Purity Reagents
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Consumable Solutions for Semiconductor Analysis
Consumable Solutions for Semiconductor Analysis
ICP/MS/MS, ICP/MS
Instrumentation
ICP/MS/MS, ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Trace Elemental Analysis of Precursor Materials Using ICP-MS/MS
Trace Elemental Analysis of Precursor Materials Using ICP-MS/MS
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Multi-Elemental Analysis of Lithium Aluminum Titanium Phosphate by Automated ICP-OES
Multi-Elemental Analysis of Lithium Aluminum Titanium Phosphate by Automated ICP-OES
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis , Energy & Chemicals
Open paper Ultratrace Impurity Analysis of Ultrapure Water with Low Boron Background by ICP-MS/MS
Ultratrace Impurity Analysis of Ultrapure Water with Low Boron Background by ICP-MS/MS
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Determination of Ultratrace Impurities in Semiconductor Photoresist Using ICP-MS/MS
Determination of Ultratrace Impurities in Semiconductor Photoresist Using ICP-MS/MS
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Automated Surface Analysis of Metal Contaminants in Silicon Wafers by Online VPD-ICP-MS/MS
Automated Surface Analysis of Metal Contaminants in Silicon Wafers by Online VPD-ICP-MS/MS
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Direct Analysis of Metallic Impurities in SiC and GaN Wafers by LA-GED-MSAG-ICP-MS/MS
Direct Analysis of Metallic Impurities in SiC and GaN Wafers by LA-GED-MSAG-ICP-MS/MS
ICP/MS, ICP/MS/MS, Laser ablation
Instrumentation
ICP/MS, ICP/MS/MS, Laser ablation
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper WCPS: Particle Analysis of Two High Purity Grades of N-Methyl-2- Pyrrolidone (NMP) using Single Particle (sp)ICP-MS/MS Method
WCPS: Particle Analysis of Two High Purity Grades of N-Methyl-2- Pyrrolidone (NMP) using Single Particle (sp)ICP-MS/MS Method
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
