Applications from the field of Semiconductor Analysis focused on FTIR Spectroscopy - page 2
Open paper Eastern Analytical Symposium & Exposition 2021 Preliminary Program
Eastern Analytical Symposium & Exposition 2021 Preliminary Program
HPLC, Consumables, LC columns, NMR, GCxGC, 2D-LC, LC/MS, FTIR Spectroscopy, GC/MS/MS, GC/QQQ, LC/MS/MS, LC/QQQ, GC, SFC, Ion Mobility, MALDI, Pyrolysis, LC/HRMS, GC/MSD, ICP-OES, Microscopy, X-ray, LC/TOF, Capillary electrophoresis
Instrumentation
HPLC, Consumables, LC columns, NMR, GCxGC, 2D-LC, LC/MS, FTIR Spectroscopy, GC/MS/MS, GC/QQQ, LC/MS/MS, LC/QQQ, GC, SFC, Ion Mobility, MALDI, Pyrolysis, LC/HRMS, GC/MSD, ICP-OES, Microscopy, X-ray, LC/TOF, Capillary electrophoresis
Manufacturer
Industries
Forensics , Environmental, Pharma & Biopharma, Semiconductor Analysis , Clinical Research, Proteomics , Food & Agriculture, Lipidomics, Materials Testing
Open paper Analysis of a CMOS Chip Circuit Board using the stand-alone FTIR Microscope LUMOS II
Analysis of a CMOS Chip Circuit Board using the stand-alone FTIR Microscope LUMOS II
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Semiconductor Analysis
Open paper Carbon and Oxygen Quantification in Silicon wafers
Carbon and Oxygen Quantification in Silicon wafers
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Semiconductor Analysis
Open paper Infrared Photoluminescence Spectroscopy
Infrared Photoluminescence Spectroscopy
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Materials Testing, Semiconductor Analysis
Open paper Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging
Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
