Applications from the field of Semiconductor Analysis focused on ICP/MS - page 6
Open paper WCPS: Determination of Ultra Trace Elements in High Purity Reagents by Automatic Standard Addition Methods Using prepFAST S - ICP-MS/MS
WCPS: Determination of Ultra Trace Elements in High Purity Reagents by Automatic Standard Addition Methods Using prepFAST S - ICP-MS/MS
Sample Preparation, ICP/MS, ICP/MS/MS
Instrumentation
Sample Preparation, ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies, Elemental Scientific
Industries
Energy & Chemicals , Semiconductor Analysis
Open paper Determination of ultratrace elements in semiconductor grade Isopropyl Alcohol using the Thermo Scientific iCAP RQ ICP-MS
Determination of ultratrace elements in semiconductor grade Isopropyl Alcohol using the Thermo Scientific iCAP RQ ICP-MS
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
Open paper Routine determination of ultratrace elements in semiconductor grade nitric acid by the Thermo Scientific iCAP RQ ICP-MS
Routine determination of ultratrace elements in semiconductor grade nitric acid by the Thermo Scientific iCAP RQ ICP-MS
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
Open paper Determination of ultratrace elements in semiconductor grade sulfuric acid using the Thermo Scientific iCAP RQ ICP-MS
Determination of ultratrace elements in semiconductor grade sulfuric acid using the Thermo Scientific iCAP RQ ICP-MS
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
Open paper Agilent ICP-MS Journal (July 2017 – Issue 69)
Agilent ICP-MS Journal (July 2017 – Issue 69)
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Pharma & Biopharma, Semiconductor Analysis
Open paper Analysis of Trace Metal Impurities in High Purity Hydrochloric Acid Using ICP-QQQ
Analysis of Trace Metal Impurities in High Purity Hydrochloric Acid Using ICP-QQQ
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS
Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Open paper WCPS: Accurate determination of Eu, and Sm in ultra-pure barium carbonate materials by ICP-QQQ
WCPS: Accurate determination of Eu, and Sm in ultra-pure barium carbonate materials by ICP-QQQ
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Open paper Agilent ICP-MS Journal (December 2016 – Issue 67)
Agilent ICP-MS Journal (December 2016 – Issue 67)
ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Semiconductor Analysis
Open paper Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ
Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
