5973 Inert Performance Electronics: Considerations for GC/MS Methods in Scan and Selective-Ion Monitoring Modes

5973 Inert Performance Electronics: Considerations for GC/MS Methods in Scan and Selected-Ion Monitoring Modes Application Technique/Technology Authors Harry F. Prest, Randy Roushall, Tom Doherty Jim Foote, and James Yano Agilent Technologies, Inc. 5301 Stevens Creek Blvd Santa Clara, CA 95051…

New Approaches to the Development of GC/MS Selected Ion Monitoring Acquisition and Quantitation Methods Technique/Technology Gas Chromatography/Mass Spectrometry Author Harry Prest 1601 California Avenue Palo Alto, CA 94304 USA David W. Peterson 1601 California Avenue Palo Alto, CA 94304 USA…

Femtogram GC/MSD Detection Limits for Environmental Semivolatiles Using a Triple-Axis Detector Application Environmental Author Mike Szelewski Agilent Technologies, Inc. 2850 Centerville Road Wilmington, DE 19808 USA Abstract The analysis of semivolatiles at very low levels presents challenges due to analyte…

Parts-per-Trillion Level Calibration of Semivolatiles Using LVI-PTV-GC/MSD Application Environmental Author Mike Szelewski Agilent Technologies, Inc. 2850 Centerville Road Wilmington, DE 19808 USA Abstract The analysis of semivolatiles in the parts-per-trillion range presents challenges due to analyte activity, background contamination, and…