Application note | AN41505 X-ray diffraction Quantification of amorphous cementitious materials based on CPL using ARL X’TRA Companion Benchtop XRD Figure 1: ARL X’TRA Companion diffraction system Authors Dr. Simon Welzmiller, Application Specialist XRD, and Raphael Yerly, Product Manager XRD…
Klíčová slova
amorphous, cpl, x’tra, companion, xrd, arl, cementitious, diffraction, mixtures, slag, rietveld, ray, ponkcs, quantification, profex