Application Note: 52297 Fast, Effective XPS Point Analysis of Metal Components Chris Baily and Tim Nunney, Thermo Fisher Scientific, East Grinstead, West Sussex, UK Key Words • K-Alpha • Auto-Analysis • Multi-Spectrum • Point Analysis • Surface Analysis • Survey…
Klíčová slova
platter, alpha, view, xps, object, dragged, point, experiment, survey, discoloration, elements, ray, scans, used, oxide