Quantitative Depth Profile (QDP) Analysis of Cr Marker in Alumina Sample

GDS Applications Lab • LECO Corporation, Saint Joseph, Michigan USA Spectroscopy Application Snapshot Quantitative Depth Profile (QDP) Analysis of 40 GB Hard Disk on Glass Substrate GDS-850A analysis showing three replicate analyses of coating layers on a laptop hard disk.…

GDS Applications Lab • LECO Corporation, Saint Joseph, Michigan USA O Spectroscopy Application Snapshot Quantitative Depth Profile (QDP) Analysis of Thin Oxide Layer on Polished Stainless Steel GDS-850A analysis showing multiple thin layers on the surface of polished stainless steel…

GDS Applications Lab • LECO Corporation, Saint Joseph, Michigan USA Zoom C Spectroscopy Application Snapshot Quantitative Depth Profile (QDP) Analysis of Commercial Hard Disk on Aluminum Alloy Substrate GDS-850A analysis of a commercial hard disk. Layers present include a thin…

GDS Applications Lab • LECO Corporation, Saint Joseph, Michigan USA Spectroscopy Application Snapshot Quantitative Depth Profile (QDP) Analysis of NIST 2135c - Ni/Cr Thin Film Depth Profile Standard GDS-850A analysis of thin film standard certifed at Cr = 206.3 ±13.8…