Scanning Probe Microscope /Atomic Force Microscope SPM-9700HT Plus

C147-E017A Scanning Probe Microscope SPM-9700HT Scanning Probe Microscope SPM-9700HT ™ Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local…

C10G-E093 Support for Product Evaluation to Quality Control of Electronic Components Instruments for Analyzing / Evaluating Electronic Devices Shimadzu Analytical and Measuring Instruments Used in Electrical/Electronic Fields Electronic devices and semiconductor technologies support a variety of industries and add comfort…

C10G-E076 Cellulose Nanofibers Solutions for Cellulose Nanofibers Application Notebook Introduction Cellulose nanofibers (CNF) are plant-derived carbon-neutral materials which are light-weight and strong, yet they also exhibit high elasticity and resistance to heat. Furthermore, the main component of CNF, cellulose, can…

C10G-E088 Analysis and Testing of Lithium-Ion Battery Materials Multifaceted Solutions for Improving Performance and Quality of Lithium-Ion Secondary Batteries In the field of transport equipment, which long life, and safety must be resolved. Research accounts for approximately 20% of CO…