Scanning Probe Microscope SPM-9700HT

C147-E020 Scanning Probe Microscope /Atomic Force Microscope SPM-9700HT Plus Observations Independent of the Operator The system and software are equipped with Analytical Intelligence, our user support technology that provides maximum support for the overall workflow, from data acquisition to analysis.…

C10G-E093 Support for Product Evaluation to Quality Control of Electronic Components Instruments for Analyzing / Evaluating Electronic Devices Shimadzu Analytical and Measuring Instruments Used in Electrical/Electronic Fields Electronic devices and semiconductor technologies support a variety of industries and add comfort…

C10G-E088 Analysis and Testing of Lithium-Ion Battery Materials Multifaceted Solutions for Improving Performance and Quality of Lithium-Ion Secondary Batteries In the field of transport equipment, which long life, and safety must be resolved. Research accounts for approximately 20% of CO…

C10G-E076 Cellulose Nanofibers Solutions for Cellulose Nanofibers Application Notebook Introduction Cellulose nanofibers (CNF) are plant-derived carbon-neutral materials which are light-weight and strong, yet they also exhibit high elasticity and resistance to heat. Furthermore, the main component of CNF, cellulose, can…