Determination of ultratrace elements in semiconductor grade sulfuric acid using the Thermo Scientific iCAP RQ ICP-MS

APPLICATION NOTE 43176 Routine determination of ultratrace elements in semiconductor grade nitric acid by the Thermo Scientific iCAP RQ ICP-MS Authors Introduction Tomoko Vincent1, Jones Hsu2, Vicki Wu3, Julian Wills1 1 Thermo Fisher Scientific, Bremen, Germany 2 BASF, Taipei, Taiwan…

Table of Contents Introduction Environmental and Food Analysis Clinical and Biological Geological Metallurgical Pharma and Nutraceutical Semiconductor Advanced Applications Videos and Useful Links Customer Testimonials iCAP TQ ICP-MS Applications Compendium Table of Contents Introduction Environmental and Food Analysis Table of…

APPLICATION NOTE 43359 Determination of ultratrace elements on silicon wafer surfaces using the Thermo Scientific iCAP TQs ICP-MS Authors Introduction Tomoko Vincent, Product Specialist, Thermo Fisher Scientific With the continual decrease in device geometries, the maximum allowable trace metallic impurity…

Semiconductor workflows Trace contaminant analysis application compendium The role of ion chromatography in the semiconductor industry Demand for semiconductor wafers will continue its vigorous growth as the demand for mobile devices, cloud computing, Internet of Things (IoT), selfdriving automobiles, artificial…