Technical Overview Instrument Detection Limit at Ultrashort Dwell Times Demonstrated on the Agilent 6495C Triple Quadrupole LC/MS Authors Charles Nichols, Behrooz Zekavat, and Patrick Batoon Agilent Technologies, Inc. Abstract This Technical Overview presents the measurement of the instrument detection limit…
Klíčová slova
idl, dwell, instrument, time, counts, chromatographic, extremely, minutes, times, short, acquisition, mrm, ion, rsd, duty