Application Note Geological, Mining, Metals Analysis of Rare Earth Elements in Base Metal Ores by ICP-OES Overcoming complex spectral interferences using an Agilent 5800 VDV ICP-OES Authors Introduction Greg Gilleland and Neli Drvodelic, Agilent Technologies, Inc. The Rare Earth Elements…
Klíčová slova
fbc, fact, mdl, off, conc, rees, elements, correction, peak, background, measured, wavelength, pump, ree, wavelengths