Aplikace z oblasti Polovodiče se zaměřením na ICP/MS/MS - strana 4
Otevřít dokument Determination of ultratrace elements in photoresist solvents using the Thermo Scientific iCAP TQs ICP-MS
Determination of ultratrace elements in photoresist solvents using the Thermo Scientific iCAP TQs ICP-MS
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Thermo Fisher Scientific, Elemental Scientific, Teledyne LABS
Zaměření
Polovodiče
Otevřít dokument Determination of ultratrace elements in semiconductor grade nitric acid using the Thermo Scientific iCAP TQs ICP-MS
Determination of ultratrace elements in semiconductor grade nitric acid using the Thermo Scientific iCAP TQs ICP-MS
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Thermo Fisher Scientific
Zaměření
Polovodiče
Otevřít dokument Thermo Scientific ICP-MS solutions for the semiconductor industry
Thermo Scientific ICP-MS solutions for the semiconductor industry
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Thermo Fisher Scientific
Zaměření
Polovodiče
Otevřít dokument Determination of ultratrace elements on silicon wafer surfaces using the Thermo Scientific iCAP TQs ICP-MS
Determination of ultratrace elements on silicon wafer surfaces using the Thermo Scientific iCAP TQs ICP-MS
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Thermo Fisher Scientific
Zaměření
Polovodiče
Otevřít dokument Agilent ICP-MS Journal (April 2018. Issue 72)
Agilent ICP-MS Journal (April 2018. Issue 72)
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Agilent Technologies
Zaměření
Potraviny a zemědělství, Polovodiče
Otevřít dokument Analysis of Ultratrace Impurities in High Purity Copper using the Agilent 8900 ICP-QQQ
Analysis of Ultratrace Impurities in High Purity Copper using the Agilent 8900 ICP-QQQ
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Agilent Technologies
Zaměření
Průmysl a chemie, Polovodiče
Otevřít dokument Ultra-low level determination of phosphorus, sulfur, silicon and chlorine using the Agilent 8900 ICP-QQQ
Ultra-low level determination of phosphorus, sulfur, silicon and chlorine using the Agilent 8900 ICP-QQQ
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Agilent Technologies
Zaměření
Polovodiče
Otevřít dokument Determination of trace elements in ultrapure semiconductor grade sulfuric acid using the Agilent 8900 ICP-QQQ in MS/MS mode
Determination of trace elements in ultrapure semiconductor grade sulfuric acid using the Agilent 8900 ICP-QQQ in MS/MS mode
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Agilent Technologies
Zaměření
Polovodiče
Otevřít dokument Automated Analysis of Semiconductor Grade Hydrogen Peroxide and DI Water using ICP-QQQ
Automated Analysis of Semiconductor Grade Hydrogen Peroxide and DI Water using ICP-QQQ
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Agilent Technologies
Zaměření
Polovodiče
Otevřít dokument Direct Analysis of Trace Metal Impurities in High Purity Nitric Acid Using ICP-QQQ
Direct Analysis of Trace Metal Impurities in High Purity Nitric Acid Using ICP-QQQ
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Agilent Technologies
Zaměření
Polovodiče
