Aplikace z oblasti Materiálová analýza se zaměřením na GC/TOF od ZOEX/JSB - strana 1

Otevřít dokument The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

Aplikace
| N/A | ZOEX/JSB
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentace
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Výrobce
JEOL, ZOEX/JSB
Zaměření
Materiálová analýza, Polovodiče