Introduction to PeakForce AFM-IR

Multimodal Nanoscale Analysis with Photothermal AFM-IR and PeakForce Tapping

PeakForce AFM-IR is a novel variant of the photothermal AFM-IR technique based on Bruker's PeakForce Tapping mode, offering monolayer detection sensitivity, 10 nm spatial resolution for IR measurements, and simultaneous nanoscale mechanical characterization. In this webinar, Bruker experts will introduce the technique and conclude with a live demonstration and Q&A.

Join us for this webinar to see:

• The role of gated signal detection in enhancing AFM-IR performance
• Simultaneous multimodal imaging of chemical information and mechanical properties, such as elastic modulus and adhesion
• Practical operation of Bruker's PeakForce AFM-IR mode through a live demonstration

Speaker: Dr. Qichi Hu (Senior Staff Applications Scientist, Bruker Nano)

Qichi is currently a Senior Staff Applications Scientist at Bruker Nano. He received a bachelor’s degree from Peking University and Ph.D. from University of British Columbia. He then did postdocs in U.S. university and national labs. Qichi has been working on nanoIR development and applications for over a decade, at Anasys and now at Bruker.

Speaker: Dr. Chunzeng Li (Senior Staff Applications Scientist, Bruker)

Dr. Chunzeng Li is a Senior Staff Applications Scientist with Bruker, Nano Surfaces and Metrology Division, with over 30 years AFM experience. He received his PhD in Physical Chemistry from Xiamen University, China, and is the author of 31 international publications and 2 patents.