Next-gen 4D-STEM and quantitative imaging with Timepix4

As dimensionality in transmission electron microscopy (TEM) expands, next-generation ultrafast detectors are making it possible to record 4D data sets at acquisition speeds comparable to traditional bright- and dark-field techniques. These advancements are paving the way for versatility in scanning TEM (STEM) and the ability to quantify charge densities with subatomic resolution, to measure polarisation-induced electric fields, and to solve the phase problem by ptychographic techniques.

Join Professor Knut Müller-Caspary, LMU Munich & Ernst-Ruska Centre and Matt Callahan, Quantum Detectors, as they hold an in-depth discussion showcasing the technologies that can transform 4D-STEM workflows to enable new levels of precision in electric field mapping, charge density analysis, and ptychographic phase retrieval. Plus, learn how you can combine real-space and reciprocal-space imaging in a single scan, and see first-hand results from pioneering applications.

Key learning objectives

• Understand how Timepix4-based detectors enable high-speed, event-driven 4D-STEM acquisition for advanced electron microscopy workflows
• Explore real-world application data from Merlin T4 deployments, including results from beam-sensitive and thick specimens
• Gain insights into integrating next-generation detectors into existing TEM setups, including software compatibility and data processing strategies

Who should attend?

• TEM users and electron microscopy researchers in materials science, semiconductors, and nanotechnology looking to advance spatial and temporal resolution through techniques like electron diffraction and 4D-STEM.
• Facility managers and imaging leads exploring next-generation detector upgrades and workflow integration.
• Data scientists and software developers working on reconstruction algorithms, ptychography, or real-time data processing in microscopy.

Certificate of attendance

• If you attend the live webinar, you will automatically receive a certificate of attendance, including a learning outcomes summary, for continuing education purposes.
• If you view the on-demand webinar, you can request a certificate of attendance by emailing [email protected].

Presenter: Prof. Knut Müller-Caspary (LMU Munich & Ernst-Ruska Centre)

Presenter: Matt Callahan (Principal Engineer, Quantum Detectors)

Moderator: Olivia Long (Editorial Team, SelectScience)