ZÁZNAM | Proběhlo Ne, 1.1.2023
Tento webinář představí dvě hlavní techniky pro infračervená měření v nanoměřítku: fototermální AFM-IR (PTIR/AFM-IR) a IR zobrazování pomocí s-SNOM (scattering scanning nearfield optical microscopy).Přejít na webinář

This webinar introduces two main techniques for nanoscale IR measurements: Photothermal AFM-IR (PTIR/AFM-IR) and IR-based Scattering Scanning Nearfield Optical Microscopy (IR s-SNOM).
The presenter, Dr. Phillips, differentiates AFM-IR and s-SNOM by comparing them to more familiar techniques:
Dr. Phillips delves into the fundamentals behind AFM-IR and s-SNOM. Both complementary modes are combined in Bruker’s nanoIR3-s platform.
Also included in this in-depth introductory webinar are:
In the Q&A session, viewers can expect to hear the answers to:
- watch part 2: Online Demo of the nanoIR3 System - Photothermal AFM-IR
- watch part 3: Chemical Characterization of Heterogenous Polymeric Materials on the Nanoscale Using Photothermal AFM-IR
- watch part 4: Nanoscale AFM-IR Spectroscopy and Imaging for Failure Analysis of Electronic Devices
- watch part 5: 2D Material Characterization Using Photothermal AFM-IR and s-SNOM
Presenter: Cassandra Phillips, Ph.D. Bruker expert