Fourth North American SIFT-MS User Meeting - Day 1

Syft Technologies invites you to join the 2020 North American user group meeting focused on the latest applications of selected ion flow tube mass spectrometry (SIFT-MS).

SIFT-MS users present their latest data from across diverse fields from food chemistry to thermal desorption to workplace safety research.

Day 1 (Times are shown US EDT)

• 1pm Welcome and procedures (Dr Vaughan Langford, Syft Technologies)

• 1.10pm PLENARY From mold worms to fake honey: using SIFT-MS to improve food quality (Prof. Sheryl Barringer, The Ohio State University)

• 1.50pm Source apportionment and quantification of liquid and headspace leaks from closed system transfer devices via SIFT-MS (Dr Amos Doepke, Dr Robert Streicher, CDC/NIOSH/HELD/CBMB)

2.15pm refreshment break

• 2.30pm Principles of solid-phase microextraction and its use in food analysis (Prof. Emanuela Gionfriddo, University of Toledo)

• 2.55pm Time-resolved thermal extraction of volatiles from plastic materials using TD-SIFT-MS (Dr Christopher Pfaff, Syft Technologies (Europe))

• 3.20pm Novel authentication of single-origin green coffee beans and detection of adulteration using on-line SIFT-MS (Dr Hardy Castada, The Ohio State University)

3.45pm refreshment break

• 4pm Comparison of sample introduction techniques like static headspace, dynamic headspace and direct thermal extraction for analysis of rancidity markers in instant food using SIFT-MS and GC/MS (Kurt Thaxton, Thomas Langenberg, Dr Eike Kleine-Benne, GERSTEL)

• 4.25pm Finishing the 2019 story: Part 1. SIFT-MS as a sensory tool for packaging screening (Dr Vaughan Langford, Syft Technologies)

• 4.50pm Concluding remarks (Dr Vaughan Langford, Syft Technologies)

5pm close for Day 1

See more details including abstracts for all presentation at SIFT-MS User Meeting web page.