Investigation of Ni on Si thin film with ARL EQUINOX 100 X-ray Diffractometer

Investigation of a CIGS solar cell with ARL EQUINOX 100 X-ray Diffractometer and ARL QUANT'X EDXRF Spectrometer Authors: Dr. Simon Welzmiller, Ju Weicai, XRD Application Specialists Introduction Copper indium gallium selenide (CIGS) is one of three predominantly used materials for…

Thermo Scientific ARL EQUINOX 100 X-ray Diffractometers Compact Flexible Applications Attachments Performance Portfolio Compact XRD solution High performance in a compact size The Thermo Scientific™ ARL™ EQUINOX 100 X-ray • Standard power supply; no external water cooling needed • Reliable…

Thermo Scientific ARL EQUINOX 100 X-ray Diffractometers Compact Flexible Applications Attachments Performance Portfolio Compact XRD solution High performance in a compact size The Thermo Scientific™ ARL™ EQUINOX 100 X-ray • Standard power supply; no external water cooling needed • Reliable…

Application note | AN41520 X-ray diffraction Analysis of ITO and h-BN thin films using GIXRD on ARL X’TRA Companion X-ray Diffractometer Authors Introduction Dr. Simon Welzmiller, Grazing Incidence X-ray Diffraction (GIXRD) is a specialized technique used to analyze Application Specialist…