Application Note: 52297 Fast, Effective XPS Point Analysis of Metal Components Chris Baily and Tim Nunney, Thermo Fisher Scientific, East Grinstead, West Sussex, UK Key Words • K-Alpha • Auto-Analysis • Multi-Spectrum • Point Analysis • Surface Analysis • Survey…
Klíčová slova
platter, alpha, xps, view, object, point, dragged, experiment, elements, survey, discoloration, ray, scans, oxide, used