WCPS: Expanding the Detectable Nanoparticle Size Range by High Resolution ICP-MS

Application Note Semiconductor Multielement Nanoparticle Analysis of Semiconductor Process Chemicals Using spICP-QQQ Characterization of Ag, Fe3O4, Al2O3, Au, and SiO2 NPs in TMAH in a single analytical run Author Yoshinori Shimamura, Donna Hsu, and Michiko Yamanaka Agilent Technologies, Inc. Introduction…

Characterization of nanoparticles in aqueous samples by ICP-MS White paper Authors Steve Wilbur, Michiko Yamanaka, and Sebastien Sannac Agilent Technologies Abstract ICP-MS has become the technique of choice for detection and characterization of nanoparticles in solution. Compared with other techniques,…

Single particle analysis of nanomaterials using the Agilent 7900 ICP-MS Application note Authors Materials, Environmental Sébastien Sannac Agilent Technologies, France Introduction Nanoparticles (NPs) are common components in a wide range of materials in industries from high technology electronics, optics, and…

Single particle analysis using the Agilent 7700x ICP-MS Application note Materials Authors Sébastien Sannac1, Soheyl Tadjiki2, Evelin Moldenhauer3 1 Agilent Technologies, France Postnova Analytics Inc., UT, USA 3 Postnova Analytics GmbH, Landsberg, Germany 2 Introduction Nanoparticles (NPs) are defined as…