Agilent ICP-MS Journal (July/August 2015 – Issue 62)

Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ Application note Semiconductor and petrochemical Authors William Geiger CONSCI, Ltd., Pasadena, Texas, USA Emmett Soffey, Steve Wilbur and Chris Scanlon Agilent Technologies Inc., USA Introduction Hydride gases, such as phosphine and…

Agilent ICP-MS Journal April 2017 – Issue 68 Inside this Issue 2-3 Direct, Rapid Analysis of Undiluted Seawater using ICP-MS with the HMI Aerosol Dilution System 3 On-Demand Webinar: Updated European Standards for Water Analysis Using ICP-MS 5 Ultrasensitive High…

Applications of ICP-MS Measuring Inorganic Impurities in Semiconductor Manufacturing Application Compendium > Return to table of contents > Search entire document Table of contents ICP-MS and ICP-QQQ in the Semiconductor Industry 4 Agilent Has Three Decades of ICP-MS Experience Driving…

Agilent 8800 Triple Quadrupole ICP-MS TECHNOLOGY TRANSFORMED. PERFORMANCE REDEFINED. AGILENT TECHNOLOGIES 8800 TRIPLE QUADRUPOLE ICP-MS Technology transformed. Performance redefined. The power of MS/MS • Unparalleled accuracy – MS/MS unleashes the full power of reaction cell ICP-MS by eliminating the variability…